ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,442, issued on May 5, was assigned to Yangtze Memory Technologies Co. Ltd. (Wuhan, China). "Managing program disturb in memory devices" was i... और पढ़ें
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,443, issued on May 5, was assigned to Kioxia Corp. (Tokyo). "Semiconductor memory device with operation-specific pass voltages" was invented ... और पढ़ें
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,444, issued on May 5, was assigned to IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) (Seoul, South Korea). "Operati... और पढ़ें
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,445, issued on May 5, was assigned to Micron Technology Inc. (Boise, Idaho). "Controlling erase-to-program delay for improving data retention... और पढ़ें
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,446, issued on May 5, was assigned to MACRONIX INTERNATIONAL Co. LTD. (Hsinchu, Taiwan). "Memory searching engine, reference array and refere... और पढ़ें
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,447, issued on May 5, was assigned to Micron Technology Inc. (Boise, Idaho). "Adaptive temperature compensation for a memory device" was inve... और पढ़ें
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,448, issued on May 5, was assigned to SK hynix NAND Product Solutions Corp. (Rancho Cordova, Calif.). "Solid state drive (SSD) with in-flight... और पढ़ें
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,449, issued on May 5, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Adaptive GIDL voltage for erasing non-volatile memory" w... और पढ़ें
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,450, issued on May 5, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Aborted operation detection for nonvolatile memory with ... और पढ़ें
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,451, issued on May 5, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Memory system, debugging device, debugging metho... और पढ़ें